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Physical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000

By: Publication details: Springer, New York, USAISBN:
  • 978-0387-258000
DDC classification:
  • G:19:(C9B5) P07/EGERTION RF/B25757
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Item type Current library Call number Status Barcode
BOOK BOOK Agharkar Research Institute G:19:(C9B5) P07/EGERTION RF/B25757 (Browse shelf(Opens below)) Available B25757

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