Physical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000 (Record no. 36175)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00321nam a2200097Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 978-0387-258000 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | G:19:(C9B5) P07/EGERTION RF/B25757 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Egertion RF |
| 245 ## - TITLE STATEMENT | |
| Title | Physical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000 |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Springer, New York, USA |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Date acquired | Source of acquisition | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Agharkar Research Institute | Agharkar Research Institute | 07/09/2007 | NA | 0.00 | G:19:(C9B5) P07/EGERTION RF/B25757 | B25757 | 24/03/2021 | 24/03/2021 | BOOK |