Physical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000
Publication details: Springer, New York, USAISBN:- 978-0387-258000
- G:19:(C9B5) P07/EGERTION RF/B25757
| Item type | Current library | Call number | Status | Barcode | |
|---|---|---|---|---|---|
BOOK
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Agharkar Research Institute | G:19:(C9B5) P07/EGERTION RF/B25757 (Browse shelf(Opens below)) | Available | B25757 |
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