000 | 00321nam a2200097Ia 4500 | ||
---|---|---|---|
100 | _aEgertion RF | ||
020 | _a978-0387-258000 | ||
245 | _aPhysical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000 | ||
260 | _bSpringer, New York, USA | ||
082 | _aG:19:(C9B5) P07/EGERTION RF/B25757 | ||
999 |
_c36175 _d36175 |