000 00321nam a2200097Ia 4500
100 _aEgertion RF
020 _a978-0387-258000
245 _aPhysical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000
260 _bSpringer, New York, USA
082 _aG:19:(C9B5) P07/EGERTION RF/B25757
999 _c36175
_d36175