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Results of search for 'ccl=Provider:Springer Verlag, Berlin, Germany', page 5 of 5
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Drews G
Grimme L H & Dumonte...
Kues U & Fischer R E...
Nevo E, Korol A B, B...
Remer L
Schiebel Ralf & H...
Singh A & Ward O P E...
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81.
Scanning electron microscopy : Physics of image formation and analysis .-2nd edn .-3-540-63976-4
by
Remer L
Edition:
2nd edn
Publication details:
Springer Verlag, Berlin, Germany
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G:19:(C9B5) N98/REMER L/B25708
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