TY  - BOOK
AU  - Egertion RF
TI  - Physical principles of electron microscopy : An introduction to TEM SEM and AEM .-978-0387-258000
SN  - 978-0387-258000
U1  - G:19:(C9B5)  P07/EGERTION RF/B25757 
PB  - Springer, New York, USA
ER  -