Goodhew Peter J; John Humpherys & Richard Beanland <br/><br/>
Electron Microscopy and Analysis .-3rd Edn .-978-0-7484-0968-8 

 - 3rd Edn  
 -  Taylor & Francis, London, London  2001 
<br/><br/><label>ISBN: </label>978-0-7484-0968-8 
<br/><br/><label>Dewey Class. No.: </label>G:19:(C9B5)   P01/B27359